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■ Abbreviation / Long Form : FIB / focused ion beam milling

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Total Number of Papers: 6
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Abbreviation:   FIB  (>> Co-occurring Abbreviation)
Long Form:   focused ion beam milling
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No. Year Title Co-occurring Abbreviation
2015 Ultramorphological assessment of dentin-resin interface after use of simplified adhesives. SUD, TEM
2013 Three-dimensional structure of laser-modified Ti6Al4V and bone interface revealed with STEM tomography. TEM
2009 Chromosome centromeres: structural and analytical investigations with high resolution scanning electron microscopy in combination with focused ion beam milling. FESEM
2009 Magnetization dynamics of Landau structures: tuning the response of mesoscopic magnetic objects using defects. XMCD-PEEM
2008 A single nanotrench in a palladium microwire for hydrogen detection. AFM, PI
2007 The analysis of the mechanosensory origin of the infrared sensilla in Melanophila acuminata (Coeloptera; Buprestidae) adduces new insight into the transduction mechanism. IR