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Abbreviation : ToF-SIMS
Long Form : Time-of-Flight SIMS
No. Year Title Co-occurring Abbreviation
2020 In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation. AFM, FIB, HV, SEM, SIMS
2016 Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2(+) cosputtering. GCIB, PET, SIMS
2016 Optimizing the sputter deposition process of polymers for the Storing Matter technique using PMMA. SIMS